VARI 2015 is the 6th International Workshop on CMOS Variability. The increasing variability in CMOS transistor characteristics, as well as its sensitivity to environmental variations has become a major challenge to scaling and integration. This leads to major changes in the way that future integrated circuits and systems are designed. Strong links must be established between circuit design, system design and device technology. The VARI workshop answers to the need to have an event on variability in CMOS technology development and circuit design, where industry and academia meet. VARI objective is to provide a forum to discuss and investigate the CMOS process and environmental variability issues in methodologies and tools for the design of current and upcoming generations of integrated circuits and systems. The technical program will focus on performance and power consumption as well as architectural aspects like adaptability or resilience, with particular emphasis on modeling, design, characterization, analysis and optimization in respect to variability. Digital, Analog, Mixed Signal and RF circuits are within VARI scope. The venue of VARI 2015 will be Slavador, Bahia, Brazil. VARI 2015 will be collocated with PATMOS 2015 and SBCCI2015.
Papers are solicited on, but not limited to, the following topics:
Accepted/Invited papers will be published in IEEE Xplore®.
Selected papers will be included in a special issue of The Journal of Low Power Electronics (JOLPE). Student Papers presented at the conference will be considered for the Best Student Paper Award. The award delivery will take place at the closing session of theworkshop