ISTERel - Integrated Systems Test and Reliability Laboratory

TRIS - Test and Reliability of Integrated Systems

 

 

We work with several aspects of the on-line and off-line test of integrated systems and complex circuits. Target applications include digital and analog circuits, programmable devices (FPGAs and FPAAs), core-based system-on-chip devices (SoCs), on-chip networks (NoCs), and embedded systems composed of software and hardware.

We have positions available for undergraduate and graduate candidates (masters and doctorate). If you´re interested, please contact one of us.  Current topics of interest include:

- design for test of hardware and software

- software-based self-testing

- Embedded software testing

- FPGA on-line testing and fault-tolerance

- Security issues in embedded systems

- FPAA testing

- processor testing

- on-line and off-line testing

- testing planning for complex systems (test generation, scheduling, etc)

- NoC testing

- NoC-based and SoC testing

 

 

Researchers

 

Marcelo Lubaszewski: luba <at> ece.ufrgs.br

 

Érika Cota: erika <at> inf.ufrgs.br.br

 

Fernanda Lima Kastensmidt:  fglima <at> inf.ufrgs.br