Conferences

LATW 2013 Dealine: November 2012

ETS 2013 Deadline: December 2012

24rd European Symposium on Reliability of Electron Devices, Failure Physics and Analysis
October 2013
Deadline: May, 2013

Design Automation Conference - DAC 2013 - http://www.dac.com/
Deadine: November 2012

NSREC 2013 - http://www.nsrec.com/call12.pdf
Deadline: February 1st, 2013

RADECS 2013 - Deadline: March, 2013

Classification by CAPES

A1

DATE - Design, Automation and Test in Europe Conference and Exhibition

ITC - International Test Conference

DAC

A2

FPGA - ACM/SIGDA International Symposium on Field-Programmable Gate Arrays

International Conference on Field-Programmable Logic and Applications

VTS - IEEE VLSI Test Symposium

B1

International Conference on Logic Programming

DFT - IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems

ACM International Conference on Computing Frontiers

IEEE International Midwest Symposium on Circuits and Systems

Iolts - IEEE International On-Line Testing Symposium

IEEE International Conference on Electronics: Circuits and Systems (ICECS)

Symposium on Integrated Circuits and Systems Design(SBCCI)

Workshop on Architecting Dependable Systems

International Symposium on Functional and Logic Programming

ISVLSI - IEEE Computer Society Annual Symposium on VLSI

B3

RADECS - Conference on RADIATION EFFECTS on COMPONENTS and SYSTEMS

VLSI-SOC - IFIP International Conference on Very Large Scale Integration

ETS - IEEE European Test Symposium

LATW – IEEE Latin American Test Workshop

LADC - Latin-American Symposium on Dependable Computing

ARES - International Conference on Availability, Reliability and Security

SERESSA 2012 - South Korea Dec 2nd to 6th, 2012**