Call for Papers The Latin-American Test Workshop provides an annual forum for test and fault tolerance professionals and technologists from Latin America and all over the world to present and discuss various aspects of system, board and component testing and fault-tolerance with design, manufacturing and field considerations in mind.               Call for papers.pdf Topics of interest include but are not limited to: Analog Mixed Signal Test Automatic Test Generation Board and System Test Built-In Self-Test Defect-Based Test Design and Synthesis for Testability Design Verification/Validation Design for Manufacturability Design of Reliable Embedded Software D&T for Electromagnetic Compatibility Economics of Test Fault Analysis and Diagnosis Fault Modeling and Simulation Fault-Tolerance in HW/SW Memory Test and Repair On-Line Testing Process Control and Measurements Radiation Hardening Techniques System-on-Chip Test Yield Optimization