No dia 03 de maio às 13:30h (Horário de Brasília) ocorrerá a palestra “It happens! Cost-Efficient Reliability for Edge-AI Chips” com Prof. Prof. Maksim Jenihhin da Tallinn University of Technology da Estônia.
Para acessar a palestra, clique aqui.
Abstract:
Very recently, Artificial Intelligence started undergoing a remarkable transformation by moving closer to the source of data, thus establishing the Edge AI concept. This trend sets new reliability requirements for the related hardware chips used for safety- and mission-critical applications. The key research and engineering challenges stem from the limited computing and energy resources of the edge devices. Furthermore, the compute-efficiency and the cost of the reliability of the Edge-AI chips are becoming enabling factors for their way to the market. The talk discusses techniques for soft-error and life-time reliability assessment and enhancement for Deep Learning accelerators. It advocates the role of approximate computing and looks into specifics of the systolic-array-, data-flow-based and industry-grade accelerator architectures for ASICs and FPGAs.
Short CV:
Maksim Jenihhin is a tenured associate professor of computing systems reliability and Head of the research group Trustworthy and Efficient Computing Hardware (TECH) at the Tallinn University of Technology, Estonia (PhD in 2008). He has published 150+ research papers and served on executive and program committees for numerous IEEE conferences (DATE, ETS, DDECS, LATS, etc.). Prof. Jenihhin coordinates national and European collaborative research projects about energy efficiency and reliability of edge-AI chips and cross-layer self-health awareness of autonomous systems.