O professor Marcelo Lubaszewski, do PGMicro e PPGC da UFRGS, realiza palestra convidada no 13th IEEE Latin American Test Workshop – LATW, em Quito, Equador, no dia 12 de abril. O título da palestra é “Designing RFID Chips for Test & Security: Towards a Reliable Internet of Things”. O evento acontecerá de 11 a 13 de Abril.
No mesmo evento serão apresentados 4 artigos com autores do PGMicro e PPGC, são eles:
– Simulation of SET Faults in a Voltage Controlled Oscillator
Walter Calienesbartra, Fernanda Kastensmidt, Ricardo Reis
– Impact of TID-induced Threshold Deviations in Analog Building-blocks of Operational Amplifiers
Guilherme Cardoso, Tiago Balen, Rafael Vaz, Marcelo Lubaszewski, Odair Gonçalvez
– SET Susceptibility Estimation of Clock Tree Networks from Layout Extraction
Raul Chipana, Fernanda Kastensmidt, Ricardo Reis
– Configurable Tool to Protect Processors against SEE by Software-based Detection Techniques
Eduardo Chielle, Raul Barth, Angelo Lapolli, Fernanda Kastensmidt
Maiores informações em: http://www.latw.tttc-events.org