Program Schedule
| Wednesday Sept. 17 | Thursday Sept. 18 | Friday Sept. 19 | |
| 08:45 | Keynote From circuits to cancer |
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| 09:00 | Opening | ||
| 09:15 | Keynote “Soft specifications” - The most economical approach to mixed-signal design and testing |
Embedded Tutorial Self-testing: key to future dependable mixed-signal integrated systems |
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| 09:30 | Session 3 Fault Modeling and ATPG for Analog and Mixed-Signal Circuits |
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| 09:45 | |||
| 10:00 | Break | Break | |
| 10:15 | |||
| 10:30 | Session 1 Timing and Phase Noise Measurement |
Break | Session 5 Radiation Effects and Fault Tolerance |
| 10:45 | |||
| 11:00 | Session 4 Built-In Self-Test |
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| 11:15 | |||
| 11:30 | |||
| 11:45 | |||
| 12:00 | Lunch | Lunch | Lunch |
| 12:30 | |||
| 13:00 | |||
| 13:30 | Special Session 1 Memristors: fabrication challenges, memory application, and neural network implementation |
Special Session 2 Networks on Chip in Emerging Interconnect Paradigms |
Session 6 Metal Corrosion Test, Real-Time Compensation and Adaptive Tuning |
| 13:45 | |||
| 14:00 | |||
| 14:15 | |||
| 14:30 | Session 2 Mixed-Signal Test Infrastructure |
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| 14:45 | |||
| 15:00 | Break | Closing Remarks | |
| 15:15 | |||
| 15:30 | Break | ||
| 15:45 | |||
| 16:00 | Panel Trends in mixed-signal test cost in current and future ICs |
Social Program | |
| 16:15 | |||
| 16:30 | |||
| 16:45 | |||
| 17:00 | |||
| 17:15 | |||
| 19:00 | Welcome Cocktail | ||
| 20:00 |
Program
| Wednesday September 17 | |
| 9:00 - 9:15 | Opening |
| Welcome Address | |
| Marcelo Lubaszewski (CEITEC-SA, BR) - IMS3TW'14 General Chair | |
| Program Introduction | |
| Florence Azais (LIRMM, FR) - IMS3TW'14 Program Chair | |
| 9:15 - 10:00 | KEYNOTE |
| Chair: Haralampos-G. Stratigopoulos (TIMA, FR) | |
| “Soft Specifications” - The Most Economical Approach to Mixed-Signal Design and Testing | |
| Oren Eliezer (CTO EverSet Technologies, US) | |
| 10:00 - 10:30 | Break |
| 10:30 - 12:00 | SESSION 1 |
| Timing and Phase Noise Measurement | |
| Chair: Jose Machado da Silva (Univ. do Porto, PT) | |
| 1,1 | Experimental Verification of Timing Measurement Circuit With Self-Calibration |
| Takeshi Chujo (Gunma University, JP), Daiki Hirabayashi (Gunma University, JP), Kentaroh Katoh (Tsuruoka National College of Technology, JP), Congbing Li (Gunma University, JP), Yutaro Kobayashi (Gunma University, JP), Junshan Wang (Gunma University, JP), Koshi Sato (Hikari Science, JP), Haruo Kobayashi (Gunma University, JP) | |
| 1,2 | Phase Noise Measurement Techniques Using Delta-Sigma TDC |
| Yusuke Osawa (Gunma University, JP), Daiki Hirabayashi (Gunma University, JP), Naohiro Harigai (Gunma University, JP), Haruo Kobayashi (Gunma University, JP), Kiichi Niitsu (Nagoya University, JP), Osamu Kobayashi (STARC, JP) | |
| 1,3 | Stochastic model for phase noise measurement from 1-bit signal acquisition |
| Stephane David-Grignot (LIRMM/NXP, FR), Florence Azais, (LIRMM, FR), Laurent Latorre (LIRMM, FR), Francois Lefevre (NXP Semiconductors, FR) | |
| 12:00 - 13:30 | Lunch |
| 13:30 - 14:30 | SPECIAL SESSION 1 |
| Memristors: fabrication challenges, memory application, and neural network implementation | |
| Organizer: Amirali Ghofrani (UCSB, USA) | |
| Moderator: Gilberto Medeiros (UFMG, BR) | |
| S1.1 | Monolithically Integrated Memristor/CMOS Hybrid Circuits |
| Qiangfei Xia (U. of Massachusetts, USA), Peng Lin (U. of Massachusetts, USA), Miguel Lastras (UCSB, USA), Amirali Ghofrani (UCSB, USA), Hao Jiang(U. of Massachusetts, USA), Melika Payvand (UCSB, USA), Luke Theogarajan (UCSB, USA), K.-T. Tim Cheng (UCSB, USA) | |
| S1.2 | A progress update on memristor-based pattern classifiers |
| Mirko Prezioso (UCSB, USA), Farnood Merrikh-Bayat (UCSB, USA), Brian Hoskins (UCSB, USA), Gina Adam (UCSB, USA), Dmitri Strukov Mirko (UCSB, USA) | |
| 14:30 - 15:30 | SESSION 2 |
| Mixed-Signal Test Infrastructure | |
| Chair: Carsten Wegener (Dialog Semiconductor, DE) | |
| 2,1 | An I2C Based Mixed-Signal Test and Measurement Infrastructure |
| Antonio Salazar (Univ. do Porto, PT), Jose Machado da Silva (Univ. do Porto, PT), Miguel Velhote Correia (Univ. do Porto, PT) | |
| 2,2 | Low cost test architecture for mixed-signal integrated circuits |
| Julio da Silva Jr. (CEITEC, BR), Emerson R. Camargo (CEITEC, BR), Douglas Foster (CEITEC, BR), Sandro T. Coelho (CEITEC, BR), Antonio A. G. de Oliveira (CEITEC, BR), Alfredo Olmos (CEITEC, BR), Marcelo Lubaszewski (CEITEC, BR) | |
| 15:30 - 16:00 | Break |
| 16:30 - 17:30 | PANEL |
| Trends in mixed-signal test cost in current and future ICs | |
| Organizer: Andre Ivanov (UBC, CA) | |
| Moderator: Salvador Mir (TIMA, FR) | |
| Panelists: Haruo Kobayashi (Gunma University, JP) Oren Eliezer (CTO EverSet Technologies, US) Michel Renovell (LIRMM, FR) Eric Lee (HTMicron, BR) Alfredo Olmos (CEITEC, BR) |
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| 19:00 | Welcome Cocktail |
| Thursday September 18 | |
| 8:45 - 9:30 | KEYNOTE |
| Chair: Hans Kerhoff (University of Twente, NL) | |
| "From Circuits to Cancer" | |
| Sani Nassif (CEO Radyalis, USA) | |
| 9:30 - 10:30 | SESSION 3 |
| Fault Modeling and ATPG for Analog and Mixed-Signal Circuits | |
| Chair: Fabian Vargas (PUCRS, BR) | |
| 3,1 | The Influence of No Faults Found in Analogue CMOS Circuits |
| Hans Kerhoff (University of Twente, NL) | |
| 3,2 | ATPG for Mixed-signal Circuits Using Commercial Digital Tools |
| Carsten Wegener (Dialog Semiconductor, DE) | |
| 10:30 - 11:00 | Break |
| 11:00 - 12:00 | SESSION 4 |
| Built-In Self-Test | |
| Chair: Eric Fabris (UFRGS) | |
| 4,1 | Non-Intrusive Built-In Test for 65nm RF LNA |
| Athanasios Dimakos (TIMA, FR), Haralampos-G. Stratigopoulos (TIMA, FR), Alexandre Siligaris (CEA-LETI, FR), Emeric De Foucauld (CEA-LETI, FR), Salvador Mir (TIMA, FR) | |
| 4,2 | Low Cost Implicit Built-In Self-Test of Passive RFID Tags |
| Suvadeep Banerjee (Georgia Tech, US), Aritra Banerjee (Georgia Tech, US), Debashis Banerjee (Georgia Tech, US), Kyujeong Lee (Samsung Electronics, KR), Abhijit Chatterjee (Georgia Tech, US) | |
| 12:00 - 13:30 | Lunch |
| 13:30 - 15:00 | SPECIAL SESSION 2 |
| Networks on Chip in Emerging Interconnect Paradigms | |
| Organizer: Partha Pande (Washington State University, USA) | |
| Moderator: Alexandre Amory (PUCRS, BR) | |
| S2.1 | Integrated Cross-Layer Solutions for Enabling Silicon Photonics into Future Chip Multiprocessors |
| Paolo Grani (Univ. of Siena, IT), Luca Ramini (Univ. of Ferrara, IT), Davide Bertozzi (Univ. of Ferrara, IT), Sandro Bartolini (University of Siena, IT) | |
| S2.2 | Elevator-First: a NoC routing strategy to cope with TSV Costs and Topology Heterogeneity of 3D-Integration |
| Hamed Sheibanyrad (LIP6 Lab, FR) | |
| S2.3 | System-Level Design Space Exploration for SoCs Integrating Optical Networks on Chip |
| F. Hessel (PUCRS, BR), G. Nicolescu (Ecole Polytechnique de Montreal, CA), F. Gohring de Magalhães (Ecole Polytechnique Montreal, CA), O. Liboiron-Ladouceur (Mc Gill University, CA) | |
| 15:00 - 15:30 | Break |
| 16:00 | Social Program |
| Friday September 19 | |
| 9:15 - 10:00 | EMBEDDED TUTORIAL |
| Chair: Jacob Abraham (University of Texas, USA) | |
| "Self-testing: key to future dependable mixed-signal integrated systems" | |
| Hans Kerhoff (University of Twente, NL) | |
| 10:00 - 10:30 | Break |
| 10:30 - 12:00 | SESSION 5 |
| Radiation Effects and Fault Tolerance | |
| Chair: Fernanda Kastensmidt (UFRGS, BR) | |
| 5,1 | Fault Mitigation Strategies for Single Event Transients on SAR converters |
| Alisson Lanot (UFRGS, BR), Tiago Balen (UFRGS, BR) | |
| 5,2 | Alternate Biasing Modular Redundancy: an alternative tolerance technique to cope with TID effects |
| Tiago Balen (UFRGS, BR), Rafael Galhardo Vaz (Instituto de Estudos Avançados, BR), Gustavo Fernandes (UFRGS, BR), Ederson Machado (UFRGS, BR), Odair Gonçalez (Instituto de Estudos Avançados, BR) | |
| 5,3 | Measuring the Impact of Voltage Scaling for Soft Errors in SRAM-based FPGAs from a Designer Perspective |
| Jorge Tonfat Seclen (UFRGS, BR), Jose Rodrigo Azambuja (FURG, BR), Gabriel Nazar (UFRGS, BR), Paolo Rech (UFRGS, BR), Luigi Carro (UFRGS, BR), Ricardo Reis (UFRGS, BR), Fernanda Kastensmidt (UFRGS, BR), Fabian Vargas (PUCRS, BR), Eduardo Bezerra (UFSC, BR), Christopher Frost (ISIS, GB) | |
| 12:00 - 13:30 | Lunch |
| 13:30 - 15:00 | SESSION 6 |
| Metal Corrosion Test, Real-Time Compensation and Adaptive Tuning | |
| Chair: Michel Renovell (LIRMM, FR) | |
| 6,1 | A Simple Electro-Chemical Test and Optimization System for Impressed Current Cathodic Corrosion Protection |
| Andre Chang (SFU, CA), Jasbir Pate (SFU, CA)l, Bozena Kaminska (SFU, CA) | |
| 6,2 | Real-Time Correction of DC Motor and Controller Failures Using Analog Checksums |
| Suvadeep Banerjee (Georgia Tech, US), Abhijit Chatterjee (Georgia Tech, US), Jacob Abraham (University of Texas, US) | |
| 6,3 | Study of Adaptive Tuning Strategies for NFC Transmitter Module |
| Mouhamadou Dieng (LIRMM/NXP, FR), Florence Azais (LIRMM, FR), Mariane Comte (LIRMM, FR), Serge Bernard (LIRMM, FR), Vincent Kerzerho (LIRMM, FR), Michel Renovell (LIRMM, FR), Thibault Kervaon (NXP Semiconductors, FR), Paul-Henri Pugliesi-Conti (NXP Semiconductors, FR) | |
| 15:00 -15:15 | Closing Remarks |
